Fix defects detected by static analysis
Change-Id: I9eba31f8f716f8d3b5b04b803bc4c9ecdf035e10 Signed-off-by:Parkhi <h_w.park@samsung.com> Reviewed-on: https://gerrit.iotivity.org/gerrit/15007Reviewed-by:
Jihun Ha <jihun.ha@samsung.com> Reviewed-by:
Madan Lanka <lanka.madan@samsung.com> Tested-by:
jenkins-iotivity <jenkins-iotivity@opendaylight.org> Reviewed-by:
Uze Choi <uzchoi@samsung.com>
Showing
Please register or sign in to comment